ASTAR Phase & Orientation Imaging PATENTED

Topspin acquisition + ASTAR analysis efficiently produces
EBSD-like data from your TEM

High resolution, high speed EBSD-like data from your TEM

Ultra-fast precession electron diffraction scanned acquisition

High resolution automated phase and orientation mapping via ASTAR analysis software developed by Dr. Edgar Rauch from SIMAP-INP Grenoble-France

Texture analysis & grain size morphology studies

Spatial resolution < 2 nm attainable (FEG TEM)

Intuitive workflow

Learn more at NanoMEGAS Sprl

See the ASTAR Series Acquisition Video

DOWNLOAD APPLICATION NOTES (PDF)

DOWNLOAD PRODUCT OVERVIEW (PDF)

Brunetti et al Chemistry of Materials 23 (2011) 4545-24   Download PDF

Ganesh et al Nanotechnology 23 (2012) 135702   Download PDF