TopspinPLUS combines dedicated EDX and STEM hardware with your modern TEM Center-equipped JEOL S/TEM (ARM200F, Grand ARM, 2800 or 2100(F) series) to achieve the high levels of automation required for fast 2D and 3D EDX + STEM experiments.

 

STEM + EDX Spectrum ImagingEDX spectrum imaging from user-specified arrays of points

Fast EDX Mapping and Basic AnalysisSynchronized beam scanning and EDX readout for fast EDX maps

EDX Tomography AcquisitionSTEM tomography combined with simultaneous EDX readout to deliver 3D chemical information

STEM Tomography AcquisitionHighly automated STEM tomography acquisition for your JEOL microscope