STEM Tomography Acquisition
Highly automated STEM tomography acquisition for your JEOL microscope
Highly automated STEM tomography acquisition
Microscope automation through TEM Center integration controls
Stage tilt
STEM autofocus
XY-drift correction
User-definable and independent acquisition parameters for autofocus, XY-drift correction and tomography series acquisition sections
Bandpass-tunable XY-drift correction
Per-frame drift correction available
Dynamic focus correction available
Intuitive workflow
Screenshot Topspin User Interaction – GaN HEMT
(STEM & Precession Electron Diffraction)
Mayenite mineral electron diffraction pattern
(changing precession angle 0-3 deg)