Please join us for an introduction to Scanning Precession Electron Diffraction (PED). In this webinar you will learn how modern TEM microscopes benefit from PED, a breakthrough in electron crystallography, now commonly used for synchronized scanning and precession.
Learn how the NanoMEGAS system provides streamlined PED acquisition with automated alignments, and analysis featuring ASTAR orientation/phase mapping and Topspin strain mapping while achieving high spatial resolution and precision. We are eager to help you extend the capabilities of your TEM beyond traditional electron diffraction techniques.
The study of nano-crystalline or amorphous materials can be optimally performed with Electron Pair Distribution Function (ePDF) in the TEM. This technique allows the study of materials at the local environment (nm scale) using collected (ED) patterns. We will show how ePDF has been recently applied to study nano-particles and amorphous materials.
In recent years there has been a huge interest in the nm scale characterization of various materials (Minerals, Zeolites, MOFS, Aperiodic crystals, Archeological artifacts, Functional materials, Organic Pharmaceuticals, Proteins etc.). We will show the use of 3D Electron Diffraction (3D-ED) in the Transmission Electron Microscope (TEM) and present various examples demonstrating the application of the 3D-ED method to successfully solve structures. Using this method the crystal unit cell, space group, and atomic positions can be determined ab initio.
With the ever growing importance for understanding nanoscale phenomena, the ability to quantify the material structure, at the appropriate length scale, is important in ultimately elucidating underlying mechanisms. In this webinar the use of scanning precession electron diffraction (SPED) in quantifying the grain texture and grain boundary character is correlated to two examples.
In the first case study, its impact in understanding nanoscale deformation is described. Here, a multilayered crystalline / amorphous multilayered stack is subjected to nano-indentation. Using SPED, the mechanical induced grain growth in the crystalline layers is captured along with grain rotation. Using finite element modeling, the loading response in the nanostructure is then able to be directly linked to the scanning PED outcomes.
In the second example, the use of SPED is cross-correlated to atom probe tips to reveal the grain boundary specificity of solute segregation enabling verification and validation of atomistic computational models.