Fast EDX Mapping and Basic Analysis
Synchronized beam scanning and EDX readout for fast EDX maps
On-the-fly EDX position tagged spectroscopy
STEM beam position control with simultaneous readout of EDX spectra
Beam position is synchronized with EDX readout, so acquisition can occur at full scan speed
Per-frame drift correction available
Dynamic focus correction for inclined specimens available
Basic analysis — integrated peak intensity profiles or images
Intuitive workflow
Screenshot Topspin User Interaction – GaN HEMT
(STEM & Precession Electron Diffraction)
Mayenite mineral electron diffraction pattern
(changing precession angle 0-3 deg)