Precession Electron Diffraction enables Phase, Orientation & Strain Mapping in your TEM
Topspin is a novel scanning and beam precession experiment framework for your Analytical Scanning Transmission Electron Microscope. NanoMEGAS USA has been the sole distributor of NanoMEGAS SPRL products in the Americas since 2008.
Webinars
An Introduction to Scanning PED, ASTAR Mapping & Strain Applications for TEM
Presented by Dr. Jing Lu, Applications Scientist for NanoMEGAS USA
Local Structure at the Nanoscale
Presented by Prof Simon Billinge, Columbia University
Structural Characterization in TEM by 3D/Micro-Ed
Presented by Dr. Partha Pratim Das, NanoMEGAS SPRL Applications Scientist
The Use of Precession Electron Diffraction for in situ Cross-correlative Microscopy
Presented by Prof Greg Thompson, University of Alabama