Precession Electron Diffraction enables Phase, Orientation & Strain Mapping in your TEM

Topspin is a novel scanning and beam precession experiment framework for your Analytical Scanning Transmission Electron Microscope. NanoMEGAS USA has been the sole distributor of NanoMEGAS SRL products in the Americas since 2008.

NEW – STRAIN ANALYSIS FOR FinFET DEVICES Watch the Topspin Demo Videos

Webinars

An Introduction to Scanning PED, ASTAR Mapping & Strain Applications for TEM Presented by Dr. Jing Lu, Applications Scientist for NanoMEGAS USA Local Structure at the Nanoscale Presented by Prof Simon Billinge, Columbia University Structural Characterization in TEM by 3D/Micro-Ed Presented by Dr. Partha Pratim Das, NanoMEGAS SRL Applications Scientist The Use of Precession Electron Diffraction for in situ Cross-correlative Microscopy Presented by Prof Greg Thompson, University of Alabama