Topspin leverages the power of precession in your TEM

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PED Scanned AcquisitionIntegrated beam precession enabling new experiments

ASTAR Phase & Orientation ImagingTopspin acquisition + ASTAR analysis efficiently produces EBSD-like data from your TEM

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Nano Crystal Characterization3D precession electron diffraction tomography with ADT3D analysis

Strain MappingMeasure engineered strain distributions in modern semiconductor devices via PED-enhanced NBD

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Your ExperimentHave an idea? Let’s collaborate and turn your idea fast in a working prototype for proof of concept experiments.
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