Ultra-fast precession electron diffraction scanned acquisition
High resolution automated phase and orientation mapping via ASTAR analysis software developed by Dr. Edgar Rauch from SIMAP-INP Grenoble-France
Texture analysis & grain size morphology studies
Spatial resolution < 2 nm attainable (FEG TEM)
Intuitive workflow
Learn more at NanoMEGAS Sprl
See the ASTAR Series Acquisition Video